Report date: Mar 26, 2024 Conflict count: 356923 Publisher: Elsevier Title count: 938 Conflict count: 15183 ========================================================== Created: 2019-11-30 16:16:33.0 ConfID: 5559249 CauseID: 1459178415 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Knight, 1 ,1,1,1989,Editorial DOI: 10.1016/0895-3996(89)90029-3(Journal) (5559249-N ) DOI: 10.3233/XST-1989-1101(Journal) ========================================================== Created: 2019-11-30 16:16:38.0 ConfID: 5559250 CauseID: 1459178423 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Baez, 1 ,1,3,1989,The early days of X-ray optics—A personal memoir DOI: 10.1016/0895-3996(89)90030-X(Journal) (5559250-N ) DOI: 10.3233/XST-1989-1102(Journal) ========================================================== Created: 2019-11-30 16:16:44.0 ConfID: 5559251 CauseID: 1459178428 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Ceglio, 1 ,1,7,1989,Revolution in X-ray optics DOI: 10.1016/0895-3996(89)90031-1(Journal) (5559251-N ) DOI: 10.3233/XST-1989-1103(Journal) ========================================================== Created: 2019-11-30 16:16:53.0 ConfID: 5559252 CauseID: 1459178433 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Tatchyn, 1 ,1,79,1989,Generation of soft X-ray/VUV photons with a hybrid/bias micropole undulator on the LLNL linac DOI: 10.1016/0895-3996(89)90032-3(Journal) (5559252-N ) DOI: 10.3233/XST-1989-1104(Journal) ========================================================== Created: 2019-11-30 16:16:59.0 ConfID: 5559253 CauseID: 1459178438 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Gray, 1 ,1,99,1989,Measured response of multilayers to damaging fluxes DOI: 10.1016/0895-3996(89)90033-5(Journal) (5559253-N ) DOI: 10.3233/XST-1989-1105(Journal) ========================================================== Created: 2019-11-30 16:17:08.0 ConfID: 5559254 CauseID: 1459178447 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Bonse, 1 ,1,107,1989,Scanning interferometer for the measurement of anomalous dispersion with synchrotron X rays DOI: 10.1016/0895-3996(89)90034-7(Journal) (5559254-N ) DOI: 10.3233/XST-1989-1106(Journal) ========================================================== Created: 2019-11-30 16:17:19.0 ConfID: 5559255 CauseID: 1459178457 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Schwarzenberger, 1 ,2,134,1989,Phase measurement X-ray interferometry DOI: 10.1016/0895-3996(89)90036-0(Journal) (5559255-N ) DOI: 10.3233/XST-1989-1202(Journal) ========================================================== Created: 2019-11-30 16:17:28.0 ConfID: 5559256 CauseID: 1459178462 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Allinson, 1 ,2,143,1989,Charge coupled device (CCD) area detector for on-line (40- to 80-ms) acquisition of Laue diffraction data from protein crystals DOI: 10.1016/0895-3996(89)90037-2(Journal) (5559256-N ) DOI: 10.3233/XST-1989-1203(Journal) ========================================================== Created: 2019-11-30 16:17:34.0 ConfID: 5559257 CauseID: 1459178467 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Tsacoyeanes, 1 ,2,154,1989,Diamond vs beryllium films for improving survivability of metal mirrors against X rays DOI: 10.1016/0895-3996(89)90038-4(Journal) (5559257-N ) DOI: 10.3233/XST-1989-1204(Journal) ========================================================== Created: 2019-11-30 16:17:44.0 ConfID: 5559258 CauseID: 1459178479 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Goodman, 1 ,2,162,1989,A comparison of DEF X-ray film and a photodiode array (Reticon) as detectors for an X-ray crystal spectrometer DOI: 10.1016/0895-3996(89)90039-6(Journal) (5559258-N ) DOI: 10.3233/XST-1989-1205(Journal) ========================================================== Created: 2019-11-30 16:17:48.0 ConfID: 5559259 CauseID: 1459178481 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Tjahjadi, 1 ,2,171,1989,The use of color in image enhancement of X-ray microtomographs DOI: 10.1016/0895-3996(89)90040-2(Journal) (5559259-N ) DOI: 10.3233/XST-1989-1206(Journal) ========================================================== Created: 2019-11-30 16:17:54.0 ConfID: 5559260 CauseID: 1459178487 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Shealy, 1 ,2,190,1989,Design of a normal incidence multilayer imaging X-ray microscope DOI: 10.1016/0895-3996(89)90041-4(Journal) (5559260-N ) DOI: 10.3233/XST-1989-1207(Journal) ========================================================== Created: 2019-11-30 16:18:03.0 ConfID: 5559261 CauseID: 1459178493 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Ford, 1 ,2,207,1989,Improved resolution of soft X-ray contact images using laser-produced plasmas DOI: 10.1016/0895-3996(89)90042-6(Journal) (5559261-N ) DOI: 10.3233/XST-1989-1208(Journal) ========================================================== Created: 2019-11-30 16:18:19.0 ConfID: 5559262 CauseID: 1459178506 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Michette, 2 ,1,1,1990,Laser-generated plasmas: Source requirements for x-ray microscopy DOI: 10.1016/0895-3996(90)90001-3(Journal) (5559262-N ) DOI: 10.3233/XST-1990-2101(Journal) ========================================================== Created: 2019-11-30 16:18:23.0 ConfID: 5559263 CauseID: 1459178511 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Henke, 2 ,1,17,1990,Design and characterization of x-ray multilayer analyzers for the 50–1000 eV region DOI: 10.1016/0895-3996(90)90002-4(Journal) (5559263-N ) DOI: 10.3233/XST-1990-2102(Journal) ========================================================== Created: 2019-11-30 16:18:34.0 ConfID: 5559264 CauseID: 1459178519 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Christensen, 2 ,2,81,1990,Studies of multilayers and thin-foil X-ray mirrors using a soft X-ray diffractometer DOI: 10.1016/0895-3996(90)90003-5(Journal) (5559264-N ) DOI: 10.3233/XST-1990-2201(Journal) ========================================================== Created: 2019-11-30 16:18:35.0 ConfID: 5559265 CauseID: 1459178520 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Niu, 2 ,2,95,1990,A new three-dimensional reconstruction method using algebraic reconstruction techniques DOI: 10.1016/0895-3996(90)90004-6(Journal) (5559265-N ) DOI: 10.3233/XST-1990-2202(Journal) ========================================================== Created: 2019-11-30 16:18:43.0 ConfID: 5559266 CauseID: 1459178525 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Chapman, 2 ,2,117,1990,Focusing and collimation of X rays using microchannel plates: An experimental investigation DOI: 10.1016/0895-3996(90)90005-7(Journal) (5559266-N ) DOI: 10.3233/XST-1990-2203(Journal) ========================================================== Created: 2019-11-30 16:18:53.0 ConfID: 5559267 CauseID: 1459178532 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Murakami, 2 ,2,127,1990,Thermal X-ray emission from ion-beam-heated matter DOI: 10.1016/0895-3996(90)90006-8(Journal) (5559267-N ) DOI: 10.3233/XST-1990-2204(Journal) ========================================================== Created: 2019-11-30 16:19:03.0 ConfID: 5559268 CauseID: 1459178545 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Karabekov, 2 ,3,161,1990,Investigation of crystal perfection by measuring the collimating slit image widening in diffracted synchrotron radiation DOI: 10.1016/0895-3996(90)90008-A(Journal) (5559268-N ) DOI: 10.3233/XST-1990-2301(Journal) ========================================================== Created: 2019-11-30 16:19:09.0 ConfID: 5559269 CauseID: 1459178550 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Partanen, 2 ,3,165,1990,An experimental and theoretical study of pendellösung fringes in synchrotron section topographs of silicon wafers DOI: 10.1016/0895-3996(90)90009-B(Journal) (5559269-N ) DOI: 10.3233/XST-1990-2302(Journal) ========================================================== Created: 2019-11-30 16:19:19.0 ConfID: 5559270 CauseID: 1459178556 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Stead, 2 ,3,172,1990,Soft x-ray contact microscopy of biological specimens: Aluminum-coated silicon nitride windows as XUV filters DOI: 10.1016/0895-3996(90)90010-J(Journal) (5559270-N ) DOI: 10.3233/XST-1990-2303(Journal) ========================================================== Created: 2019-11-30 16:19:24.0 ConfID: 5559271 CauseID: 1459178564 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Davis, 2 ,3,180,1990,DuMond diagram mappings for multi asymmetric crystal monochromators DOI: 10.1016/0895-3996(90)90011-A(Journal) (5559271-N ) DOI: 10.3233/XST-1990-2304(Journal) ========================================================== Created: 2019-11-30 16:19:33.0 ConfID: 5559272 CauseID: 1459178570 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Yao, 2 ,3,195,1990,Synchrotron white beam topographic imaging in grazing Bragg-Laue geometries DOI: 10.1016/0895-3996(90)90012-B(Journal) (5559272-N ) DOI: 10.3233/XST-1990-2305(Journal) ========================================================== Created: 2019-11-30 16:19:38.0 ConfID: 5559273 CauseID: 1459178576 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Zegenhagen, 2 ,3,214,1990,X-ray standing wave analysis of highly perfect Cu crystals and electrodeposited submonolayers of Cd and Tl on Cu surfaces DOI: 10.1016/0895-3996(90)90013-C(Journal) (5559273-N ) DOI: 10.3233/XST-1990-2306(Journal) ========================================================== Created: 2019-11-30 16:19:44.0 ConfID: 5559274 CauseID: 1459178580 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Gaponov, 2 ,4,241,1990,Normal-incidence multilayer mirrors for the 120–450 Å wavelength region DOI: 10.1016/0895-3996(90)90014-D(Journal) (5559274-N ) DOI: 10.3233/XST-1990-2401(Journal) ========================================================== Created: 2019-11-30 16:19:53.0 ConfID: 5559275 CauseID: 1459178586 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Elliott, 2 ,4,249,1990,Application of X-ray microtomography in materials science illustrated by a study of a continuous fiber metal matrix composite DOI: 10.1016/0895-3996(90)90015-E(Journal) (5559275-N ) DOI: 10.3233/XST-1990-2402(Journal) ========================================================== Created: 2019-11-30 16:20:00.0 ConfID: 5559276 CauseID: 1459178594 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Eidmann, 2 ,4,259,1990,Characterization of pinhole transmission gratings DOI: 10.1016/0895-3996(90)90016-F(Journal) (5559276-N ) DOI: 10.3233/XST-1990-2403(Journal) ========================================================== Created: 2019-11-30 16:20:08.0 ConfID: 5559277 CauseID: 1459178597 OtherID: 60987077 JT: Journal of X-Ray Science and Technology MD: Rarback, 2 ,4,274,1990,Coherent radiation for x-ray imaging—The soft x-ray undulator and the X1A beamline at the NSLS DOI: 10.1016/0895-3996(90)90017-G(Journal) (5559277-N ) DOI: 10.3233/XST-1990-2404(Journal) ========================================================== Created: 2019-11-30 16:20:28.0 ConfID: 5559278 CauseID: 1459178614 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Nishimura, 3 ,1,14,1991,Influence of exposure time on the sensitivity of Kodak 101 X-ray film DOI: 10.1016/0895-3996(91)90008-T(Journal) (5559278-N ) DOI: 10.3233/XST-1991-3102(Journal) ========================================================== Created: 2019-11-30 16:20:33.0 ConfID: 5559279 CauseID: 1459178621 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Puik, 3 ,1,19,1991,Characterization of a multilayer coated laminar reflection grating at λ = 0.154 nm DOI: 10.1016/0895-3996(91)90009-U(Journal) (5559279-N ) DOI: 10.3233/XST-1991-3103(Journal) ========================================================== Created: 2019-11-30 16:20:39.0 ConfID: 5559280 CauseID: 1459178625 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Elsner, 3 ,1,35,1991,Effective area of the AXAF X-Ray telescope: Dependence upon dielectric constants of coating materials DOI: 10.1016/0895-3996(91)90010-4(Journal) (5559280-N ) DOI: 10.3233/XST-1991-3104(Journal) ========================================================== Created: 2019-11-30 16:20:48.0 ConfID: 5559281 CauseID: 1459178631 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Khan Malek, 3 ,1,45,1991,A review of microfabrication technologies: Application to X-ray optics DOI: 10.1016/0895-3996(91)90011-T(Journal) (5559281-N ) DOI: 10.3233/XST-1991-3105(Journal) ========================================================== Created: 2019-11-30 16:20:53.0 ConfID: 5559282 CauseID: 1459178636 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Harvey, 3 ,1,68,1991,Diffraction effects in grazing incidence X-ray telescopes DOI: 10.1016/0895-3996(91)90012-U(Journal) (5559282-N ) DOI: 10.3233/XST-1991-3106(Journal) ========================================================== Created: 2019-11-30 16:20:59.0 ConfID: 5559283 CauseID: 1459178642 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Speller, 3 ,2,77,1992,Tissue characterization using low angle x-ray scattering DOI: 10.1016/0895-3996(92)90001-Z(Journal) (5559283-N ) DOI: 10.3233/XST-1992-3201(Journal) ========================================================== Created: 2019-11-30 16:21:09.0 ConfID: 5559284 CauseID: 1459178651 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Voss, 3 ,2,85,1992,A scanning soft x-ray microscope with an ellipsoidal focusing mirror DOI: 10.1016/0895-3996(92)90002-2(Journal) (5559284-N ) DOI: 10.3233/XST-1992-3202(Journal) ========================================================== Created: 2019-11-30 16:21:19.0 ConfID: 5559285 CauseID: 1459178660 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Boher, 3 ,2,118,1992,Tungsten/magnesium silicide multilayers for soft x-ray optics DOI: 10.1016/0895-3996(92)90004-4(Journal) (5559285-N ) DOI: 10.3233/XST-1992-3204(Journal) ========================================================== Created: 2019-11-30 16:21:34.0 ConfID: 5559286 CauseID: 1459178670 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Graeff, 3 ,2,152,1992,Synchrotron radiation white beam topography with an oscillating monochromator DOI: 10.1016/0895-3996(92)90006-6(Journal) (5559286-N ) DOI: 10.3233/XST-1992-3206(Journal) ========================================================== Created: 2019-11-30 16:21:39.0 ConfID: 5559287 CauseID: 1459178678 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Kalata, 3 ,3,157,1992,The detective quantum efficiency of television X-ray detectors DOI: 10.1016/0895-3996(92)90007-7(Journal) (5559287-N ) DOI: 10.3233/XST-1992-3301(Journal) ========================================================== Created: 2019-11-30 16:21:53.0 ConfID: 5559288 CauseID: 1459178687 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Dhez, 3 ,3,176,1992,Multilayer X-ray mirror calibration by an energy dispersive method using an X-ray tube and a Si(Li) detector: Absolute reflectivity, energy band pass, and overlapping order determination DOI: 10.1016/0895-3996(92)90009-9(Journal) (5559288-N ) DOI: 10.3233/XST-1992-3303(Journal) ========================================================== Created: 2019-11-30 16:21:59.0 ConfID: 5559289 CauseID: 1459178692 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Ceglio, 3 ,3,194,1992,Wafer cost analysis for a Soft X-Ray Projection Lithography system DOI: 10.1016/0895-3996(92)90010-H(Journal) (5559289-N ) DOI: 10.3233/XST-1992-3304(Journal) ========================================================== Created: 2019-11-30 16:22:08.0 ConfID: 5559290 CauseID: 1459178698 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Filatova, 3 ,3,204,1992,The Yoneda effect in the region of ultrasoft X-ray radiation DOI: 10.1016/0895-3996(92)90011-8(Journal) (5559290-N ) DOI: 10.3233/XST-1992-3305(Journal) ========================================================== Created: 2019-11-30 16:22:14.0 ConfID: 5559291 CauseID: 1459178706 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Aristov, 3 ,3,211,1992,Dynamic X-ray diffraction by a multilayer mirror modulated with a transverse acoustic wave DOI: 10.1016/0895-3996(92)90012-9(Journal) (5559291-N ) DOI: 10.3233/XST-1992-3306(Journal) ========================================================== Created: 2019-11-30 16:22:19.0 ConfID: 5559292 CauseID: 1459178711 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Allred, 3 ,3,222,1992,Raman spectroscopic analysis of Mo/Si multilayers DOI: 10.1016/0895-3996(92)90013-A(Journal) (5559292-N ) DOI: 10.3233/XST-1992-3307(Journal) ========================================================== Created: 2019-11-30 16:22:33.0 ConfID: 5559293 CauseID: 1459178721 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: MacGowan, 3 ,4,231,1992,Investigation of damage to multilayer optics in x-ray laser cavities: W/C, WRe/C, WC/C, stainless-steel/C, and Cr3C2/C mirrors DOI: 10.1016/0895-3996(92)90015-C(Journal) (5559293-N ) DOI: 10.3233/XST-1992-3401(Journal) ========================================================== Created: 2019-11-30 16:22:44.0 ConfID: 5559294 CauseID: 1459178729 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Gullikson, 3 ,4,283,1992,A soft x-ray/EUV reflectometer based on a laser produced plasma source DOI: 10.1016/0895-3996(92)90016-D(Journal) (5559294-N ) DOI: 10.3233/XST-1992-3402(Journal) ========================================================== Created: 2019-11-30 16:22:48.0 ConfID: 5559295 CauseID: 1459178736 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Zukowski, 3 ,4,300,1992,Magnetic form factor of nickel determined by white beam x-ray diffraction DOI: 10.1016/0895-3996(92)90017-E(Journal) (5559295-N ) DOI: 10.3233/XST-1992-3403(Journal) ========================================================== Created: 2019-11-30 16:22:54.0 ConfID: 5559296 CauseID: 1459178741 OtherID: 62721080 JT: Journal of X-Ray Science and Technology MD: Burge, 3 ,4,311,1992,X-ray microscopy at suboptical resolution: Direct observation of the 65-nm periodicity in collagen fibrils DOI: 10.1016/0895-3996(92)90018-F(Journal) (5559296-N ) DOI: 10.3233/XST-1992-3404(Journal) ========================================================== Created: 2019-11-30 16:23:03.0 ConfID: 5559297 CauseID: 1459178746 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: FILATOVA, 4 ,1,1,1993,The anisotropy of X-ray reflection and scattering from hexagonal BN DOI: 10.1016/S0895-3996(05)80028-X(Journal) (5559297-N ) DOI: 10.3233/XST-1993-4101(Journal) ========================================================== Created: 2019-11-30 16:23:14.0 ConfID: 5559298 CauseID: 1459178753 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: LAWSON, 4 ,1,18,1993,Flux maximization techniques for compton backscatter depth profilometry DOI: 10.1016/S0895-3996(05)80030-8(Journal) (5559298-N ) DOI: 10.3233/XST-1993-4103(Journal) ========================================================== Created: 2019-11-30 16:23:28.0 ConfID: 5559299 CauseID: 1459178767 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: TOMOV, 4 ,1,44,1993,Picosecond X-ray pulses generated in a diode driven by 193-nm picosecond laser pulses DOI: 10.1016/S0895-3996(05)80032-1(Journal) (5559299-N ) DOI: 10.3233/XST-1993-4105(Journal) ========================================================== Created: 2019-11-30 16:23:33.0 ConfID: 5559300 CauseID: 1459178771 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: ZWICKER, 4 ,1,57,1993,Analysis of impurity content and transport in tokamak plasmas using low-resolution XUV spectra DOI: 10.1016/S0895-3996(05)80033-3(Journal) (5559300-N ) DOI: 10.3233/XST-1993-4106(Journal) ========================================================== Created: 2019-11-30 16:23:54.0 ConfID: 5559301 CauseID: 1459178787 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: MUTIKAINEN, 4 ,2,82,1994,Large-area pressure-enduring entrance windows for soft X-ray regime DOI: 10.1016/S0895-3996(05)80020-5(Journal) (5559301-N ) DOI: 10.3233/XST-1994-4202(Journal) ========================================================== Created: 2019-11-30 16:23:59.0 ConfID: 5559302 CauseID: 1459178795 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: TARRIO, 4 ,2,96,1994,The new NIST/ARPA national soft X-ray reflectometry facility DOI: 10.1016/S0895-3996(05)80021-7(Journal) (5559302-N ) DOI: 10.3233/XST-1994-4203(Journal) ========================================================== Created: 2019-11-30 16:24:08.0 ConfID: 5559303 CauseID: 1459178800 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: ELLIOTT, 4 ,2,102,1994,Application of scanning microradiography and X-ray microtomography to studies of bones and teeth DOI: 10.1016/S0895-3996(05)80022-9(Journal) (5559303-N ) DOI: 10.3233/XST-1994-4204(Journal) ========================================================== Created: 2019-11-30 16:24:14.0 ConfID: 5559304 CauseID: 1459178804 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: SPILLER, 4 ,2,118,1994,Diffraction-limited large X-ray optics DOI: 10.1016/S0895-3996(05)80023-0(Journal) (5559304-N ) DOI: 10.3233/XST-1994-4205(Journal) ========================================================== Created: 2019-11-30 16:24:34.0 ConfID: 5559305 CauseID: 1459178821 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: SAREEN, 4 ,2,151,1994,Developments in X-ray detectors and associated electronics: A review of the technology and possible future trends DOI: 10.1016/S0895-3996(05)80026-6(Journal) (5559305-N ) DOI: 10.3233/XST-1994-4208(Journal) ========================================================== Created: 2019-11-30 16:24:43.0 ConfID: 5559306 CauseID: 1459178826 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: HAWRYLUK, 4 ,3,167,1994,Power loading limitations in soft x-ray projection lithography DOI: 10.1016/S0895-3996(05)80055-2(Journal) (5559306-N ) DOI: 10.3233/XST-1993-4301(Journal) ========================================================== Created: 2019-11-30 16:24:50.0 ConfID: 5559307 CauseID: 1459178833 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: VIITANEN, 4 ,3,182,1994,Comparison of ultrathin x-ray window designs DOI: 10.1016/S0895-3996(05)80056-4(Journal) (5559307-N ) DOI: 10.3233/XST-1993-4302(Journal) ========================================================== Created: 2019-11-30 16:24:58.0 ConfID: 5559308 CauseID: 1459178838 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: DAVIS, 4 ,3,191,1994,The effect of linear interpolation of the filtered projections on image noise in x-ray computed tomography DOI: 10.1016/S0895-3996(05)80057-6(Journal) (5559308-N ) DOI: 10.3233/XST-1993-4303(Journal) ========================================================== Created: 2019-11-30 16:25:03.0 ConfID: 5559309 CauseID: 1459178841 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: BRIDOU, 4 ,3,200,1994,Grazing x-ray reflectometry data processing by fourier transform DOI: 10.1016/S0895-3996(05)80058-8(Journal) (5559309-N ) DOI: 10.3233/XST-1993-4304(Journal) ========================================================== Created: 2019-11-30 16:25:09.0 ConfID: 5559310 CauseID: 1459178848 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: GEPPERT, 4 ,3,217,1994,Application of structural phase transitions in x-ray spectroscopy DOI: 10.1016/S0895-3996(05)80059-X(Journal) (5559310-N ) DOI: 10.3233/XST-1993-4305(Journal) ========================================================== Created: 2019-11-30 16:25:23.0 ConfID: 5559311 CauseID: 1459178858 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: LUCCIO, 4 ,4,247,1994,Coherent compton x-ray sources DOI: 10.1016/S0895-3996(05)80043-6(Journal) (5559311-N ) DOI: 10.3233/XST-1994-4401(Journal) ========================================================== Created: 2019-11-30 16:25:30.0 ConfID: 5559312 CauseID: 1459178864 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: UMSTADTER, 4 ,4,263,1994,Ultrashort ultraviolet free-electron lasers DOI: 10.1016/S0895-3996(05)80044-8(Journal) (5559312-N ) DOI: 10.3233/XST-1994-4402(Journal) ========================================================== Created: 2019-11-30 16:25:43.0 ConfID: 5559313 CauseID: 1459178875 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: HMELO, 4 ,4,290,1994,Nondestructive evaluation of millimeter scale engineered structures using synchrotron x-ray microtomography DOI: 10.1016/S0895-3996(05)80046-1(Journal) (5559313-N ) DOI: 10.3233/XST-1993-4404(Journal) ========================================================== Created: 2019-11-30 16:25:49.0 ConfID: 5559314 CauseID: 1459178883 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: TOMPKINS, 4 ,4,301,1994,Application of graphite mosaic monochromator crystals for x-ray transport DOI: 10.1016/S0895-3996(05)80047-3(Journal) (5559314-N ) DOI: 10.3233/XST-1994-4405(Journal) ========================================================== Created: 2019-11-30 16:25:58.0 ConfID: 5559315 CauseID: 1459178889 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: KIEFFER, 4 ,4,312,1994,X-ray sources based on subpicosecond-laser-produced plasmas DOI: 10.1016/S0895-3996(05)80048-5(Journal) (5559315-N ) DOI: 10.3233/XST-1994-4406(Journal) ========================================================== Created: 2019-11-30 16:26:05.0 ConfID: 5559316 CauseID: 1459178894 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: CARROLL, 4 ,4,323,1994,Use of monochromatic x rays in medical diagnosis and therapy what is it going to take? DOI: 10.1016/S0895-3996(05)80049-7(Journal) (5559316-N ) DOI: 10.3233/XST-1994-4407(Journal) ========================================================== Created: 2019-11-30 16:26:10.0 ConfID: 5559317 CauseID: 1459178899 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: BOONE, 4 ,4,334,1994,A figure of merit comparison between bremsstrahlung and monoenergetic x-ray sources for angiography DOI: 10.1016/S0895-3996(05)80050-3(Journal) (5559317-N ) DOI: 10.3233/XST-1994-4408(Journal) ========================================================== Created: 2019-11-30 16:26:19.0 ConfID: 5559318 CauseID: 1459178906 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: DONG, 4 ,4,346,1994,Current status of the VU MFEL compton x-ray program DOI: 10.1016/S0895-3996(05)80051-5(Journal) (5559318-N ) DOI: 10.3233/XST-1994-4409(Journal) ========================================================== Created: 2019-11-30 16:26:28.0 ConfID: 5559319 CauseID: 1459178912 OtherID: 204578876 JT: Journal of X-Ray Science and Technology MD: NELSON, 4 ,4,353,1994,Large area image plane sensors for radiography DOI: 10.1016/S0895-3996(05)80052-7(Journal) (5559319-N ) DOI: 10.3233/XST-1994-4410(Journal) ========================================================== Created: 2019-11-30 16:26:33.0 ConfID: 5559320 CauseID: 1459178918 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: SHEALY, 5 ,1,1,1995,Optical analysis of an ultra-high resolution two-mirror soft x-ray microscope DOI: 10.1016/S0895-3996(05)80008-4(Journal) (5559320-N ) DOI: 10.3233/XST-1995-5101(Journal) ========================================================== Created: 2019-11-30 16:26:40.0 ConfID: 5559321 CauseID: 1459178923 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: DURFEE, 5 ,1,20,1995,Goldhelox: A soft x-ray solar telescope DOI: 10.1016/S0895-3996(05)80009-6(Journal) (5559321-N ) DOI: 10.3233/XST-1995-5102(Journal) ========================================================== Created: 2019-11-30 16:26:48.0 ConfID: 5559322 CauseID: 1459178927 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: GLUSKIN, 5 ,1,29,1995,Soft x-ray instrumentation and its applications at the advanced photon source DOI: 10.1016/S0895-3996(05)80010-2(Journal) (5559322-N ) DOI: 10.3233/XST-1995-5103(Journal) ========================================================== Created: 2019-11-30 16:26:54.0 ConfID: 5559323 CauseID: 1459178936 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: PETERSON, 5 ,1,43,1995,A capillary discharge as a potential x-ray laser driver DOI: 10.1016/S0895-3996(05)80011-4(Journal) (5559323-N ) DOI: 10.3233/XST-1995-5104(Journal) ========================================================== Created: 2019-11-30 16:26:59.0 ConfID: 5559324 CauseID: 1459178941 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: STEAD, 5 ,1,52,1995,The use of soft x rays to study the ultrastructure of living biological material DOI: 10.1016/S0895-3996(05)80012-6(Journal) (5559324-N ) DOI: 10.3233/XST-1995-5105(Journal) ========================================================== Created: 2019-11-30 16:27:08.0 ConfID: 5559325 CauseID: 1459178945 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: CHERNOV, 5 ,1,65,1995,Study of the inner structure of Co/C and Ni/C multilayers prepared by pulsed laser evaporation method DOI: 10.1016/S0895-3996(05)80013-8(Journal) (5559325-N ) DOI: 10.3233/XST-1995-5106(Journal) ========================================================== Created: 2019-11-30 16:27:13.0 ConfID: 5559326 CauseID: 1459178951 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: YAAKOBI, 5 ,1,73,1995,Monochromatic backlighting as a laser-fusion diagnostic DOI: 10.1016/S0895-3996(05)80014-X(Journal) (5559326-N ) DOI: 10.3233/XST-1995-5107(Journal) ========================================================== Created: 2019-11-30 16:27:24.0 ConfID: 5559327 CauseID: 1459178958 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: RIDGELEY, 5 ,1,88,1995,An elliptical crystal spectrometer suitable for EXAFS studies of laser compressed materials and for high resolution x-ray spectroscopy DOI: 10.1016/S0895-3996(05)80015-1(Journal) (5559327-N ) DOI: 10.3233/XST-1995-5108(Journal) ========================================================== Created: 2019-11-30 16:27:29.0 ConfID: 5559328 CauseID: 1459178966 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: DAIDO, 5 ,1,105,1995,Subnanosecond in-line soft x-ray holography using germanium laser in the 20 nm wavelength region DOI: 10.1016/S0895-3996(05)80016-3(Journal) (5559328-N ) DOI: 10.3233/XST-1995-5109(Journal) ========================================================== Created: 2019-11-30 16:27:34.0 ConfID: 5559329 CauseID: 1459178970 OtherID: 176448304 JT: Journal of X-Ray Science and Technology MD: DIEHL, 5 ,1,121,1995,Microstructural and chemical characterization of the inconel/Ti(N) thin film and multilayer system DOI: 10.1016/S0895-3996(05)80017-5(Journal) (5559329-N ) DOI: 10.3233/XST-1995-5110(Journal) ========================================================== Created: 2019-11-30 16:27:48.0 ConfID: 5559330 CauseID: 1459178979 OtherID: 166608353 JT: Journal of X-Ray Science and Technology MD: BAC, 5 ,2,161,1995,Theoretical and experimental investigation of X-ray diffraction by a lamellar multilayer amplitude grating DOI: 10.1016/S0895-3996(05)80001-1(Journal) (5559330-N ) DOI: 10.3233/XST-1995-5201(Journal) ========================================================== Created: 2019-11-30 16:27:54.0 ConfID: 5559331 CauseID: 1459178985 OtherID: 166608353 JT: Journal of X-Ray Science and Technology MD: GIAKOS, 5 ,2,181,1995,Engineering aspects of a kinestatic charge detector DOI: 10.1016/S0895-3996(05)80002-3(Journal) (5559331-N ) DOI: 10.3233/XST-1995-5202(Journal) ========================================================== Created: 2019-11-30 16:28:03.0 ConfID: 5559332 CauseID: 1459178992 OtherID: 166608353 JT: Journal of X-Ray Science and Technology MD: MEDENWALDT, 5 ,2,202,1995,Production of ultra thin silicon foils DOI: 10.1016/S0895-3996(05)80003-5(Journal) (5559332-N ) DOI: 10.3233/XST-1995-5203(Journal) ========================================================== Created: 2019-11-30 16:28:18.0 ConfID: 5559333 CauseID: 1459179004 OtherID: 166608353 JT: Journal of X-Ray Science and Technology MD: LEHNERT, 5 ,2,221,1995,Ray tracing for crystal-diffraction spectrometers with position-sensitive detectors DOI: 10.1016/S0895-3996(05)80005-9(Journal) (5559333-N ) DOI: 10.3233/XST-1995-5205(Journal) ========================================================== Created: 2019-11-30 16:28:23.0 ConfID: 5559334 CauseID: 1459179007 OtherID: 166608353 JT: Journal of X-Ray Science and Technology MD: JORDAN, 5 ,2,228,1995,Entrance window design parameters for high-pressure gas x-ray imaging detectors DOI: 10.1016/S0895-3996(05)80006-0(Journal) (5559334-N ) DOI: 10.3233/XST-1995-5206(Journal) ========================================================== Created: 2019-11-30 16:29:34.0 ConfID: 5559335 CauseID: 1459179069 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: FRAENKEL, 5 ,4,341,1995,Multiple reflections in single crystals as a tool for X-ray spectroscopy DOI: 10.1016/S0895-3996(85)80001-X(Journal) (5559335-N ) DOI: 10.3233/XST-1995-5401(Journal) ========================================================== Created: 2019-11-30 16:29:39.0 ConfID: 5559336 CauseID: 1459179073 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: PAHL, 5 ,4,368,1995,A crystal camera for ultra-small-angle x-ray scattering using synchrotron radiation DOI: 10.1016/S0895-3996(85)80002-1(Journal) (5559336-N ) DOI: 10.3233/XST-1995-5402(Journal) ========================================================== Created: 2019-11-30 16:29:48.0 ConfID: 5559337 CauseID: 1459179082 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: PONOMAREV, 5 ,4,379,1995,ReflEXAFS spectroscopy of thin Fe/Sc multilayers DOI: 10.1016/S0895-3996(85)80003-3(Journal) (5559337-N ) DOI: 10.3233/XST-1995-5403(Journal) ========================================================== Created: 2019-11-30 16:29:54.0 ConfID: 5559338 CauseID: 1459179087 OtherID: 207083168 JT: Journal of X-Ray Science and Technology MD: CHERNOV, 5 ,4,389,1995,Structural changes study of Co/C and Ni/C multilayers upon annealing DOI: 10.1016/S0895-3996(85)80004-5(Journal) (5559338-N ) DOI: 10.3233/XST-1995-5404(Journal)